X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing
The ceramic flux for submerged arc-surfacing with main component composition MgO (10.0 wt. %)-Al2O3 (25.0 wt. %)-SiO2 (40.0 wt. %)-CaF2 (25.0 wt. %) was prepared in a disk dryer-granulator using a sodium/potassium silicate solution as a binder. X-ray powder diffraction (XRPD) collected at r.t. i...
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University of Belgrade, Technical Faculty, Bor
2012-01-01
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| Series: | Journal of Mining and Metallurgy. Section B: Metallurgy |
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| Online Access: | http://www.doiserbia.nb.rs/img/doi/1450-5339/2012/1450-53391200002S.pdf |
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| author | Sokolsky V.E. Roik A.S. Davidenko A.V. Kazimirov V.P. Lisnyak V.V. Galinich V.I. Goncharov I.A. |
| author_facet | Sokolsky V.E. Roik A.S. Davidenko A.V. Kazimirov V.P. Lisnyak V.V. Galinich V.I. Goncharov I.A. |
| author_sort | Sokolsky V.E. |
| collection | DOAJ |
| description | The ceramic flux for submerged arc-surfacing with main component composition MgO (10.0 wt. %)-Al2O3 (25.0 wt. %)-SiO2 (40.0 wt. %)-CaF2 (25.0 wt. %) was prepared in a disk dryer-granulator using a sodium/potassium silicate solution as a binder. X-ray powder diffraction (XRPD) collected at r.t. identified α- phase of quartz, Al2O3, MgO and CaF2 of the initial components in the samples taken after granulation and subsequent annealing at 600 °C. In contrast to the low temperature annealing, anorthite (CaAl2Si2O8) is the main phase in the composition of the samples remelted at 1500 °C and quenched subsequently. Chemical analysis performed by means of scanning electron microscopy with energy-dispersive X-ray spectroscopy analysis (SEM/EDX) detects that the grains of the remelted samples possess the same Ca : Al : Si elemental ratio as anorthite. High temperature X-ray diffraction (HTXRD) was used to examine structural transformation in the solid at 600 °C < T < 1200 °C and stages of thermal evolution of ceramic flux were determined. The ceramic flux melts completely at the temperature above 1350 °C. The intensity pattern of the flux melt was obtained by X-ray diffraction of scattered X-rays at 1450 °C. After calculating the structure factor (SF), the radial distribution function (RDF) was evaluated and used to calculate the structural basicity of the flux melt. |
| format | Article |
| id | doaj-art-8eb14f83fcab41849501b08e4330e354 |
| institution | Kabale University |
| issn | 1450-5339 |
| language | English |
| publishDate | 2012-01-01 |
| publisher | University of Belgrade, Technical Faculty, Bor |
| record_format | Article |
| series | Journal of Mining and Metallurgy. Section B: Metallurgy |
| spelling | doaj-art-8eb14f83fcab41849501b08e4330e3542025-02-02T04:14:40ZengUniversity of Belgrade, Technical Faculty, BorJournal of Mining and Metallurgy. Section B: Metallurgy1450-53392012-01-0148110111310.2298/JMMB101223002SX-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacingSokolsky V.E.Roik A.S.Davidenko A.V.Kazimirov V.P.Lisnyak V.V.Galinich V.I.Goncharov I.A.The ceramic flux for submerged arc-surfacing with main component composition MgO (10.0 wt. %)-Al2O3 (25.0 wt. %)-SiO2 (40.0 wt. %)-CaF2 (25.0 wt. %) was prepared in a disk dryer-granulator using a sodium/potassium silicate solution as a binder. X-ray powder diffraction (XRPD) collected at r.t. identified α- phase of quartz, Al2O3, MgO and CaF2 of the initial components in the samples taken after granulation and subsequent annealing at 600 °C. In contrast to the low temperature annealing, anorthite (CaAl2Si2O8) is the main phase in the composition of the samples remelted at 1500 °C and quenched subsequently. Chemical analysis performed by means of scanning electron microscopy with energy-dispersive X-ray spectroscopy analysis (SEM/EDX) detects that the grains of the remelted samples possess the same Ca : Al : Si elemental ratio as anorthite. High temperature X-ray diffraction (HTXRD) was used to examine structural transformation in the solid at 600 °C < T < 1200 °C and stages of thermal evolution of ceramic flux were determined. The ceramic flux melts completely at the temperature above 1350 °C. The intensity pattern of the flux melt was obtained by X-ray diffraction of scattered X-rays at 1450 °C. After calculating the structure factor (SF), the radial distribution function (RDF) was evaluated and used to calculate the structural basicity of the flux melt.http://www.doiserbia.nb.rs/img/doi/1450-5339/2012/1450-53391200002S.pdfCeramic fluxubmerged arc-surfacingStructureScanning electron microscopyEnergy-dispersive X-ray spectroscopyHigh-temperature X-ray diffractionAnorthite |
| spellingShingle | Sokolsky V.E. Roik A.S. Davidenko A.V. Kazimirov V.P. Lisnyak V.V. Galinich V.I. Goncharov I.A. X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing Journal of Mining and Metallurgy. Section B: Metallurgy Ceramic flux ubmerged arc-surfacing Structure Scanning electron microscopy Energy-dispersive X-ray spectroscopy High-temperature X-ray diffraction Anorthite |
| title | X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing |
| title_full | X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing |
| title_fullStr | X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing |
| title_full_unstemmed | X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing |
| title_short | X-ray diffraction and SEM/EDX studies on technological evolution of the oxide-fluoride ceramic flux for submerged arc-surfacing |
| title_sort | x ray diffraction and sem edx studies on technological evolution of the oxide fluoride ceramic flux for submerged arc surfacing |
| topic | Ceramic flux ubmerged arc-surfacing Structure Scanning electron microscopy Energy-dispersive X-ray spectroscopy High-temperature X-ray diffraction Anorthite |
| url | http://www.doiserbia.nb.rs/img/doi/1450-5339/2012/1450-53391200002S.pdf |
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