Genetic analysis identifies key loci for traits and resistance in Qinghai plateau wheat F2 populations
Abstract The Qinghai Plateau’s high-altitude conditions present significant challenges for wheat cultivation, demanding varieties with enhanced adaptability and stress resistance. However, the genetic basis for key traits like grain yield and stress tolerance in wheat adapted to these conditions rem...
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| Main Authors: | Demei Liu, Ahmed H. El-Sappah, Ahmed S. Eldomiaty, Haiqing Wang, Wenjie Chen, Ruijuan Liu, Jicheng Shen, Fahui Ye |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-08-01
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| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-11892-0 |
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