Attachment Style, Task Difficulty, and Feedback Type: Effects on Cognitive Load

This study examines how attachment styles influence cognitive load during a dot counting task with varying difficulty levels and feedback types. From an initial pool of 96 participants, 27 were selected based on attachment classifications from the Experiences in Close Relationships-Revised (ECR-R) q...

Full description

Saved in:
Bibliographic Details
Main Authors: Dor Mizrahi, Ilan Laufer, Inon Zuckerman
Format: Article
Language:English
Published: MDPI AG 2025-03-01
Series:Behavioral Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-328X/15/4/427
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This study examines how attachment styles influence cognitive load during a dot counting task with varying difficulty levels and feedback types. From an initial pool of 96 participants, 27 were selected based on attachment classifications from the Experiences in Close Relationships-Revised (ECR-R) questionnaire. These participants completed the task while receiving personal and group-based feedback, and EEG recordings monitored cognitive load using the theta/beta ratio (TBR). Results show that negative personal feedback consistently elevated cognitive load across all attachment styles. Avoidant and fearful-avoidant individuals did not exhibit significant differences in cognitive load between positive and negative group feedback, suggesting a relatively stable response regardless of feedback valence. In contrast, securely attached individuals showed increased cognitive load under negative feedback conditions. Furthermore, individuals with higher attachment-related anxiety or avoidance experienced more pronounced increases in cognitive load as task difficulty increased. These findings suggest that attachment-related differences shape cognitive responses to feedback and task complexity level. The study highlights the role of adaptive feedback strategies in optimizing cognitive engagement across different attachment profiles.
ISSN:2076-328X