Short-Wave Infrared (SWIR) Imaging for Robust Material Classification: Overcoming Limitations of Visible Spectrum Data
This paper presents a novel approach to material classification using short-wave infrared (SWIR) imaging, aimed at applications where differentiating visually similar objects based on material properties is essential, such as in autonomous driving. Traditional vision systems, relying on visible spec...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-11-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/14/23/11049 |
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