Short-Wave Infrared (SWIR) Imaging for Robust Material Classification: Overcoming Limitations of Visible Spectrum Data

Short-Wave Infrared (SWIR) Imaging for Robust Material Classification: Overcoming Limitations of Visible Spectrum Data

This paper presents a novel approach to material classification using short-wave infrared (SWIR) imaging, aimed at applications where differentiating visually similar objects based on material properties is essential, such as in autonomous driving. Traditional vision systems, relying on visible spec...

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Bibliographic Details
Main Authors: Hanbin Song, Sanghyeop Yeo, Youngwan Jin, Incheol Park, Hyeongjin Ju, Yagiz Nalcakan, Shiho Kim
Format: Article
Language:English
Published: MDPI AG 2024-11-01
Series:Applied Sciences
Subjects:
material classification
short-wave infrared
multi-spectral imaging
multi-modal object detection
autonomous driving safety
Online Access:https://www.mdpi.com/2076-3417/14/23/11049
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