Vacuum frequency measurement of 7S3-7P4 transition in Cr atoms using laser-induced fluorescence
The nanometric length traceability chain is the foundation of cutting-edge research at the nanoscale. The current traceability chain has limitations in its applications. However, the application performance of the nanometric traceability chain based on the ^7 S _3 - ^7 P _4 transition in chromium at...
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| Main Authors: | Tong Zhou, Xiao Deng, Zhijun Yin, Guangxu Xiao, Junyu Shen, Lei Sun, Fangsheng Ren, Dongbai Xue, Yuying Xie, Jing Yu, Ming Kong, Jianbo Wang, Cong Yin, Xinbin Cheng, Tongbao Li |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2024-01-01
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| Series: | Applied Physics Express |
| Online Access: | https://doi.org/10.35848/1882-0786/ad9702 |
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