HAFREE: A Heatmap-Based Anchor-Free Detector for Apple Defect Detection
Accurate inspection of subtle defects on apple surfaces is necessary in agricultural engineering. However, existing methods often rely on expensive equipment and encounter difficulty in detecting small defect areas effectively. To address this challenge, we introduce the Subtle Surface Defects in Ap...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2024-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10776948/ |
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