A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions
Based on parallel light, a device for measuring sample emissivity under vacuum and low temperature was established. In this paper, a new emissivity measurement formula was designed, which replaces the derivation of Kirchhoff’s law of thermal radiation. The device is designed with a light-weight blac...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-11-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/14/22/10369 |
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