A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions
Based on parallel light, a device for measuring sample emissivity under vacuum and low temperature was established. In this paper, a new emissivity measurement formula was designed, which replaces the derivation of Kirchhoff’s law of thermal radiation. The device is designed with a light-weight blac...
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MDPI AG
2024-11-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/14/22/10369 |
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| author | Xufeng Liu Zhenyuan Zhang Guojin Feng |
| author_facet | Xufeng Liu Zhenyuan Zhang Guojin Feng |
| author_sort | Xufeng Liu |
| collection | DOAJ |
| description | Based on parallel light, a device for measuring sample emissivity under vacuum and low temperature was established. In this paper, a new emissivity measurement formula was designed, which replaces the derivation of Kirchhoff’s law of thermal radiation. The device is designed with a light-weight blackbody, an improved cooling speed, and an improved PID temperature control system to achieve a good temperature stability, close to 1 mK. The device is capable of measuring within a wavelength range of 4 μm to 16 μm. The results of the uncertainty assessment show that the uncertainty of the normal emissivity is better than 1.6% in the range of 4 μm to 7 μm, and better than 0.6% in the range of 7 μm to 14 μm (<i>k</i> = 1) at 0 °C. |
| format | Article |
| id | doaj-art-8a29d8905d9e4e9983a2e3c3230e2905 |
| institution | OA Journals |
| issn | 2076-3417 |
| language | English |
| publishDate | 2024-11-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Applied Sciences |
| spelling | doaj-art-8a29d8905d9e4e9983a2e3c3230e29052025-08-20T02:08:12ZengMDPI AGApplied Sciences2076-34172024-11-0114221036910.3390/app142210369A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum ConditionsXufeng Liu0Zhenyuan Zhang1Guojin Feng2National Institute of Metrology of China, Beijing 100029, ChinaBeijing Key Laboratory of Performance Guarantee on Urban Rail Transit Vehicles, Beijing University of Civil Engineering and Architecture, Beijing 100044, ChinaNational Institute of Metrology of China, Beijing 100029, ChinaBased on parallel light, a device for measuring sample emissivity under vacuum and low temperature was established. In this paper, a new emissivity measurement formula was designed, which replaces the derivation of Kirchhoff’s law of thermal radiation. The device is designed with a light-weight blackbody, an improved cooling speed, and an improved PID temperature control system to achieve a good temperature stability, close to 1 mK. The device is capable of measuring within a wavelength range of 4 μm to 16 μm. The results of the uncertainty assessment show that the uncertainty of the normal emissivity is better than 1.6% in the range of 4 μm to 7 μm, and better than 0.6% in the range of 7 μm to 14 μm (<i>k</i> = 1) at 0 °C.https://www.mdpi.com/2076-3417/14/22/10369calibrationnormal emissivityparallel lightlight-weight blackbody |
| spellingShingle | Xufeng Liu Zhenyuan Zhang Guojin Feng A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions Applied Sciences calibration normal emissivity parallel light light-weight blackbody |
| title | A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions |
| title_full | A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions |
| title_fullStr | A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions |
| title_full_unstemmed | A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions |
| title_short | A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions |
| title_sort | measurement device for the normal spectral emissivity of materials under low temperature and vacuum conditions |
| topic | calibration normal emissivity parallel light light-weight blackbody |
| url | https://www.mdpi.com/2076-3417/14/22/10369 |
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