Liu, X., Zhang, Z., & Feng, G. A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions. MDPI AG.
Chicago Style (17th ed.) CitationLiu, Xufeng, Zhenyuan Zhang, and Guojin Feng. A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions. MDPI AG.
MLA (9th ed.) CitationLiu, Xufeng, et al. A Measurement Device for the Normal Spectral Emissivity of Materials Under Low-Temperature and Vacuum Conditions. MDPI AG.
Warning: These citations may not always be 100% accurate.