The Use of Nuclear Scanning Microprobe to Study Radiation-Induced Migration of Impurities at the Grain Boundaries in Construction Materials
The application of scanning nuclear microprobe for study a radiation-induced migration of impurities at the grain boundaries in structural materials was considered. The work describes the sample preparation for a further irradiation of microscopic areas which include a few grains. Copper samples wit...
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| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2016-03-01
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| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2016/1/articles/jnep_2016_V8_01014.pdf |
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| Summary: | The application of scanning nuclear microprobe for study a radiation-induced migration of impurities at the grain boundaries in structural materials was considered. The work describes the sample preparation for a further irradiation of microscopic areas which include a few grains. Copper samples with deposited sulfur film were used in the present work. Determinations of a chemical composition of the samples, as well as a mapping of the element distribution, were based on the analysis of characteristic paticle induced X-ray emission (PIXE). Two-dimensional distribution maps of elements, that revealed a presence of randomly distributed inclusions of silicon as a result of mechanical treatment, were obtained using the method of micro-PIXE. The quality difference of sulfur films deposited by thermal evaporation and a drop method was shown. |
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| ISSN: | 2077-6772 |