Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution dete...

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Bibliographic Details
Main Authors: S. S. Gritcov, G. F. Sorokin, T. V. Shestacova
Format: Article
Language:English
Published: Politehperiodika 2018-12-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
Online Access:https://tkea.com.ua/index.php/journal/article/view/135
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