Pseudo-ring tests resolution for dynamic single faults in word-oriented memory

This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution dete...

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Main Authors: S. S. Gritcov, G. F. Sorokin, T. V. Shestacova
Format: Article
Language:English
Published: Politehperiodika 2018-12-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
Online Access:https://tkea.com.ua/index.php/journal/article/view/135
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author S. S. Gritcov
G. F. Sorokin
T. V. Shestacova
author_facet S. S. Gritcov
G. F. Sorokin
T. V. Shestacova
author_sort S. S. Gritcov
collection DOAJ
description This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.
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series Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
spelling doaj-art-88f4ae4c451c47f0b2ce5ed01f2c257e2025-08-20T03:14:19ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182309-99922018-12-015–63910.15222/TKEA2018.5-6.03135Pseudo-ring tests resolution for dynamic single faults in word-oriented memoryS. S. Gritcov0G. F. Sorokin1T. V. Shestacova2Technical University of Moldova, Chisinau, MoldovaTechnical University of Moldova, Chisinau, MoldovaTechnical University of Moldova, Chisinau, MoldovaThis paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.https://tkea.com.ua/index.php/journal/article/view/135dynamic single faultspseudo-ring testingiteration
spellingShingle S. S. Gritcov
G. F. Sorokin
T. V. Shestacova
Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
dynamic single faults
pseudo-ring testing
iteration
title Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
title_full Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
title_fullStr Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
title_full_unstemmed Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
title_short Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
title_sort pseudo ring tests resolution for dynamic single faults in word oriented memory
topic dynamic single faults
pseudo-ring testing
iteration
url https://tkea.com.ua/index.php/journal/article/view/135
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AT gfsorokin pseudoringtestsresolutionfordynamicsinglefaultsinwordorientedmemory
AT tvshestacova pseudoringtestsresolutionfordynamicsinglefaultsinwordorientedmemory