Pseudo-ring tests resolution for dynamic single faults in word-oriented memory
This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution dete...
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| Format: | Article |
| Language: | English |
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Politehperiodika
2018-12-01
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| Series: | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
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| Online Access: | https://tkea.com.ua/index.php/journal/article/view/135 |
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| _version_ | 1849712293977260032 |
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| author | S. S. Gritcov G. F. Sorokin T. V. Shestacova |
| author_facet | S. S. Gritcov G. F. Sorokin T. V. Shestacova |
| author_sort | S. S. Gritcov |
| collection | DOAJ |
| description | This paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests. |
| format | Article |
| id | doaj-art-88f4ae4c451c47f0b2ce5ed01f2c257e |
| institution | DOAJ |
| issn | 2225-5818 2309-9992 |
| language | English |
| publishDate | 2018-12-01 |
| publisher | Politehperiodika |
| record_format | Article |
| series | Tekhnologiya i Konstruirovanie v Elektronnoi Apparature |
| spelling | doaj-art-88f4ae4c451c47f0b2ce5ed01f2c257e2025-08-20T03:14:19ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182309-99922018-12-015–63910.15222/TKEA2018.5-6.03135Pseudo-ring tests resolution for dynamic single faults in word-oriented memoryS. S. Gritcov0G. F. Sorokin1T. V. Shestacova2Technical University of Moldova, Chisinau, MoldovaTechnical University of Moldova, Chisinau, MoldovaTechnical University of Moldova, Chisinau, MoldovaThis paper presents single dynamic faults and methods for their detection. Such dynamic faults as dRDF, dDRDF and dIRF are considered in detail. Also, pseudo-ring testing and the principles of single dynamic faults detecting by pseudo-ring tests are considered. The paper presents the resolution determination results for pseudo-ring tests in relation to these faults in the word-oriented memory. Also, a comparative analysis of the pseudo-ring tests with known March tests is done. The results show that pseudo-ring tests with an algorithmic complexity of (30-60)N, where N is the number of all memory cells, can cover from 75 to 100% of all single dynamic faults. This advantage allows using pseudo-ring tests as an alternative to existing classical and March tests.https://tkea.com.ua/index.php/journal/article/view/135dynamic single faultspseudo-ring testingiteration |
| spellingShingle | S. S. Gritcov G. F. Sorokin T. V. Shestacova Pseudo-ring tests resolution for dynamic single faults in word-oriented memory Tekhnologiya i Konstruirovanie v Elektronnoi Apparature dynamic single faults pseudo-ring testing iteration |
| title | Pseudo-ring tests resolution for dynamic single faults in word-oriented memory |
| title_full | Pseudo-ring tests resolution for dynamic single faults in word-oriented memory |
| title_fullStr | Pseudo-ring tests resolution for dynamic single faults in word-oriented memory |
| title_full_unstemmed | Pseudo-ring tests resolution for dynamic single faults in word-oriented memory |
| title_short | Pseudo-ring tests resolution for dynamic single faults in word-oriented memory |
| title_sort | pseudo ring tests resolution for dynamic single faults in word oriented memory |
| topic | dynamic single faults pseudo-ring testing iteration |
| url | https://tkea.com.ua/index.php/journal/article/view/135 |
| work_keys_str_mv | AT ssgritcov pseudoringtestsresolutionfordynamicsinglefaultsinwordorientedmemory AT gfsorokin pseudoringtestsresolutionfordynamicsinglefaultsinwordorientedmemory AT tvshestacova pseudoringtestsresolutionfordynamicsinglefaultsinwordorientedmemory |