Interconnection mechanism and strengthening behavior of nano-silver sintered joints for silicon carbide power module packaging: A combined EBSD and nanoindentation study
Investigating the interconnection and strengthening mechanisms of die-attach layers is instrumental for advancing die attach process toward low-pressure and, ultimately, pressureless sintering while maintaining reliability. This study compares the microstructure and micromechanical heterogeneity of...
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| Main Authors: | Chao Gu, Xiao Hu, Xuyang Yan, Wei Chen, Junwei Chen, Kai Lu, Tao Wang, Guoqi Zhang, Jiajie Fan |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2025-09-01
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| Series: | Journal of Materials Research and Technology |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2238785425017934 |
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