Su, R., Jing, Y., Zhang, X., Jiang, Y., Gao, D., Schwarzenbach, W., . . . Zhang, R. Impact of the Schottky Barrier Height on the Carrier Velocity Overshoot Behaviors in SOI nMOSFETs With Metal Source/Drain. IEEE.
Chicago Style (17th ed.) CitationSu, Rui, et al. Impact of the Schottky Barrier Height on the Carrier Velocity Overshoot Behaviors in SOI NMOSFETs With Metal Source/Drain. IEEE.
MLA (9th ed.) CitationSu, Rui, et al. Impact of the Schottky Barrier Height on the Carrier Velocity Overshoot Behaviors in SOI NMOSFETs With Metal Source/Drain. IEEE.
Warning: These citations may not always be 100% accurate.