Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Nature Portfolio
2025-01-01
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| Series: | Scientific Reports |
| Online Access: | https://doi.org/10.1038/s41598-025-88061-w |
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| _version_ | 1832571870704041984 |
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| author | Mehran Motamedi Reza Shidpour Mehdi Ezoji |
| author_facet | Mehran Motamedi Reza Shidpour Mehdi Ezoji |
| author_sort | Mehran Motamedi |
| collection | DOAJ |
| format | Article |
| id | doaj-art-8818af71e6eb45b9b4e7d98d7a444355 |
| institution | Kabale University |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-01-01 |
| publisher | Nature Portfolio |
| record_format | Article |
| series | Scientific Reports |
| spelling | doaj-art-8818af71e6eb45b9b4e7d98d7a4443552025-02-02T12:16:16ZengNature PortfolioScientific Reports2045-23222025-01-011511110.1038/s41598-025-88061-wAuthor Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patternsMehran Motamedi0Reza Shidpour1Mehdi Ezoji2Department of Materials Engineering, Babol Noshirvani University of TechnologyDepartment of Materials Engineering, Babol Noshirvani University of TechnologyFaculty of Electrical and Computer Engineering, Babol Noshirvani University of Technologyhttps://doi.org/10.1038/s41598-025-88061-w |
| spellingShingle | Mehran Motamedi Reza Shidpour Mehdi Ezoji Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns Scientific Reports |
| title | Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns |
| title_full | Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns |
| title_fullStr | Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns |
| title_full_unstemmed | Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns |
| title_short | Author Correction: LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns |
| title_sort | author correction lstm based framework for predicting point defect percentage in semiconductor materials using simulated xrd patterns |
| url | https://doi.org/10.1038/s41598-025-88061-w |
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