Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources
Coherent X-ray diffraction imaging is a lens-less microscopy technique that emerged with the advent of third-generation synchrotrons, modern detectors and computers. It can image isolated micrometre-sized objects with a spatial resolution of a few nanometres. The method is based on the inversion of...
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International Union of Crystallography
2025-05-01
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| Online Access: | https://journals.iucr.org/paper?S2052252525001526 |
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| author | Yuriy Chushkin Federico Zontone |
| author_facet | Yuriy Chushkin Federico Zontone |
| author_sort | Yuriy Chushkin |
| collection | DOAJ |
| description | Coherent X-ray diffraction imaging is a lens-less microscopy technique that emerged with the advent of third-generation synchrotrons, modern detectors and computers. It can image isolated micrometre-sized objects with a spatial resolution of a few nanometres. The method is based on the inversion of the speckle pattern in the far field produced by the scattering from the object under coherent illumination. The retrieval of the missing phase is performed using an iterative algorithm that numerically phases the amplitudes from the intensities of speckles measured with sufficient oversampling. Two- and three-dimensional imaging is obtained by simple inverse Fourier transform. This lens-less imaging technique has been applied to various specimens for their structural characterization on the nanoscale. Here, we review the theoretical and experimental elements of the technique, its achievements, and its limitations at third-generation synchrotrons. We also discuss the new opportunities offered by modern fourth-generation synchrotrons and outline the developments necessary to maximize the potential of the technique. |
| format | Article |
| id | doaj-art-8790330d5c1d4f36af4bbba7dd2ac776 |
| institution | OA Journals |
| issn | 2052-2525 |
| language | English |
| publishDate | 2025-05-01 |
| publisher | International Union of Crystallography |
| record_format | Article |
| series | IUCrJ |
| spelling | doaj-art-8790330d5c1d4f36af4bbba7dd2ac7762025-08-20T02:19:55ZengInternational Union of CrystallographyIUCrJ2052-25252025-05-0112328028710.1107/S2052252525001526ro5044Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sourcesYuriy Chushkin0Federico Zontone1ESRF – The European Synchrotron, 71 avenue des Martyrs, 38000 Grenoble, FranceESRF – The European Synchrotron, 71 avenue des Martyrs, 38000 Grenoble, FranceCoherent X-ray diffraction imaging is a lens-less microscopy technique that emerged with the advent of third-generation synchrotrons, modern detectors and computers. It can image isolated micrometre-sized objects with a spatial resolution of a few nanometres. The method is based on the inversion of the speckle pattern in the far field produced by the scattering from the object under coherent illumination. The retrieval of the missing phase is performed using an iterative algorithm that numerically phases the amplitudes from the intensities of speckles measured with sufficient oversampling. Two- and three-dimensional imaging is obtained by simple inverse Fourier transform. This lens-less imaging technique has been applied to various specimens for their structural characterization on the nanoscale. Here, we review the theoretical and experimental elements of the technique, its achievements, and its limitations at third-generation synchrotrons. We also discuss the new opportunities offered by modern fourth-generation synchrotrons and outline the developments necessary to maximize the potential of the technique.https://journals.iucr.org/paper?S2052252525001526coherent x-ray diffraction imagingcxdimaterials sciencenanosciencex-ray microscopysynchrotron radiation |
| spellingShingle | Yuriy Chushkin Federico Zontone Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources IUCrJ coherent x-ray diffraction imaging cxdi materials science nanoscience x-ray microscopy synchrotron radiation |
| title | Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources |
| title_full | Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources |
| title_fullStr | Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources |
| title_full_unstemmed | Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources |
| title_short | Prospects for coherent X-ray diffraction imaging at fourth-generation synchrotron sources |
| title_sort | prospects for coherent x ray diffraction imaging at fourth generation synchrotron sources |
| topic | coherent x-ray diffraction imaging cxdi materials science nanoscience x-ray microscopy synchrotron radiation |
| url | https://journals.iucr.org/paper?S2052252525001526 |
| work_keys_str_mv | AT yuriychushkin prospectsforcoherentxraydiffractionimagingatfourthgenerationsynchrotronsources AT federicozontone prospectsforcoherentxraydiffractionimagingatfourthgenerationsynchrotronsources |