RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film
In recent years, synthesis of TiC reinforced Cu matrix composites are comprehensively utilized for industrial applications. Synthesis of Cu-TiC as a thin film can also be an intriguing challenge for such applications. In this work, Cu-TiC thin film was deposited by DC magnetron co-sputtering method...
Saved in:
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2020-01-01
|
| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/ab7e49 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850195041147944960 |
|---|---|
| author | Avishek Roy Shilabati Hembram Manojit Ghosh Abhijit Majumdar |
| author_facet | Avishek Roy Shilabati Hembram Manojit Ghosh Abhijit Majumdar |
| author_sort | Avishek Roy |
| collection | DOAJ |
| description | In recent years, synthesis of TiC reinforced Cu matrix composites are comprehensively utilized for industrial applications. Synthesis of Cu-TiC as a thin film can also be an intriguing challenge for such applications. In this work, Cu-TiC thin film was deposited by DC magnetron co-sputtering method and examined to investigate the role of C content on the micro-structure, electrical conductivity and surface morphology by using XRD, UV–vis spectroscopy, I-V characteristics, AFM, SEM and EDX analysis. The wt% of C was varied from 14 to 67% while depositing the Cu-TiC films. All the films have resulted to be polycrystalline with Cu and TiC phases. The optical band-gap has decreased from 2.59 to 1.93 eV and the refractive index got enhanced from 2.92 to 3.38 with increase in wt% of C. The ideality factor, electrical resistance, surface roughness across the films has also decreased as wt% of C was increased in Cu-TiC films. |
| format | Article |
| id | doaj-art-877fbd32faf84302a43bf20140dbb3bb |
| institution | OA Journals |
| issn | 2053-1591 |
| language | English |
| publishDate | 2020-01-01 |
| publisher | IOP Publishing |
| record_format | Article |
| series | Materials Research Express |
| spelling | doaj-art-877fbd32faf84302a43bf20140dbb3bb2025-08-20T02:13:52ZengIOP PublishingMaterials Research Express2053-15912020-01-017303640610.1088/2053-1591/ab7e49RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin filmAvishek Roy0https://orcid.org/0000-0001-7784-1455Shilabati Hembram1Manojit Ghosh2Abhijit Majumdar3Department of Electronics, Vidyasagar College , 39 Sankar Ghosh Lane, Kolkata-700006, India; Department of Physics, Indian Institute of Engineering Science and Technology , Shibpur, Howrah-711103, IndiaDepartment of Metallurgy and Materials Engineering, Indian Institute of Engineering Science and Technology , Shibpur, Howrah-711103, IndiaDepartment of Metallurgy and Materials Engineering, Indian Institute of Engineering Science and Technology , Shibpur, Howrah-711103, IndiaDepartment of Physics, Indian Institute of Engineering Science and Technology , Shibpur, Howrah-711103, IndiaIn recent years, synthesis of TiC reinforced Cu matrix composites are comprehensively utilized for industrial applications. Synthesis of Cu-TiC as a thin film can also be an intriguing challenge for such applications. In this work, Cu-TiC thin film was deposited by DC magnetron co-sputtering method and examined to investigate the role of C content on the micro-structure, electrical conductivity and surface morphology by using XRD, UV–vis spectroscopy, I-V characteristics, AFM, SEM and EDX analysis. The wt% of C was varied from 14 to 67% while depositing the Cu-TiC films. All the films have resulted to be polycrystalline with Cu and TiC phases. The optical band-gap has decreased from 2.59 to 1.93 eV and the refractive index got enhanced from 2.92 to 3.38 with increase in wt% of C. The ideality factor, electrical resistance, surface roughness across the films has also decreased as wt% of C was increased in Cu-TiC films.https://doi.org/10.1088/2053-1591/ab7e49DC magnetron sputteringC contentXRDoptical band-gapsurface morphology |
| spellingShingle | Avishek Roy Shilabati Hembram Manojit Ghosh Abhijit Majumdar RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film Materials Research Express DC magnetron sputtering C content XRD optical band-gap surface morphology |
| title | RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film |
| title_full | RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film |
| title_fullStr | RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film |
| title_full_unstemmed | RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film |
| title_short | RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film |
| title_sort | retracted carbon impact on surface morphology and electrical properties of cu tic thin film |
| topic | DC magnetron sputtering C content XRD optical band-gap surface morphology |
| url | https://doi.org/10.1088/2053-1591/ab7e49 |
| work_keys_str_mv | AT avishekroy retractedcarbonimpactonsurfacemorphologyandelectricalpropertiesofcuticthinfilm AT shilabatihembram retractedcarbonimpactonsurfacemorphologyandelectricalpropertiesofcuticthinfilm AT manojitghosh retractedcarbonimpactonsurfacemorphologyandelectricalpropertiesofcuticthinfilm AT abhijitmajumdar retractedcarbonimpactonsurfacemorphologyandelectricalpropertiesofcuticthinfilm |