RETRACTED: Carbon impact on surface morphology and electrical properties of Cu-TiC thin film
In recent years, synthesis of TiC reinforced Cu matrix composites are comprehensively utilized for industrial applications. Synthesis of Cu-TiC as a thin film can also be an intriguing challenge for such applications. In this work, Cu-TiC thin film was deposited by DC magnetron co-sputtering method...
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| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2020-01-01
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| Series: | Materials Research Express |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2053-1591/ab7e49 |
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| Summary: | In recent years, synthesis of TiC reinforced Cu matrix composites are comprehensively utilized for industrial applications. Synthesis of Cu-TiC as a thin film can also be an intriguing challenge for such applications. In this work, Cu-TiC thin film was deposited by DC magnetron co-sputtering method and examined to investigate the role of C content on the micro-structure, electrical conductivity and surface morphology by using XRD, UV–vis spectroscopy, I-V characteristics, AFM, SEM and EDX analysis. The wt% of C was varied from 14 to 67% while depositing the Cu-TiC films. All the films have resulted to be polycrystalline with Cu and TiC phases. The optical band-gap has decreased from 2.59 to 1.93 eV and the refractive index got enhanced from 2.92 to 3.38 with increase in wt% of C. The ideality factor, electrical resistance, surface roughness across the films has also decreased as wt% of C was increased in Cu-TiC films. |
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| ISSN: | 2053-1591 |