Calculation of the Effective Dielectric Constant and Capacitance of Slit and Plane-Parallel Capacitors with High Temperature Stability Characteristics Based on a Multilayer Ferroelectric Structure

Calculation of the Effective Dielectric Constant and Capacitance of Slit and Plane-Parallel Capacitors with High Temperature Stability Characteristics Based on a Multilayer Ferroelectric Structure

Introduction. The creation of a modern electronic component base with improved characteristics is possible with the use of new materials and technologies for their manufacture. Therefore, it is important to analyze the electrical parameters of electronic components when using materials in their desi...

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Bibliographic Details
Main Authors: I. G. Mironenko, S. S. Sokolov, M. E. Shevchenko, V. S. Severikov, Kong Che Fam, A. I. Protchenko, N. N. Sharova, A. P. Burovikhin, A. A. Ivanov
Format: Article
Language:Russian
Published: Saint Petersburg Electrotechnical University "LETI" 2024-12-01
Series:Известия высших учебных заведений России: Радиоэлектроника
Subjects:
layered structure
ferroelectric capacitor structures
variconds
Online Access:https://re.eltech.ru/jour/article/view/949
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