Dong, Y., Zhou, Z., Liu, K., & Yang, X. Multi-Stress Accelerated Degradation Testing Reliability Assessment of LED Lamp Beads Considering Generalized Coupling. MDPI AG.
Chicago Style (17th ed.) CitationDong, Yinglong, Zhen Zhou, Kaixin Liu, and Xu Yang. Multi-Stress Accelerated Degradation Testing Reliability Assessment of LED Lamp Beads Considering Generalized Coupling. MDPI AG.
MLA (9th ed.) CitationDong, Yinglong, et al. Multi-Stress Accelerated Degradation Testing Reliability Assessment of LED Lamp Beads Considering Generalized Coupling. MDPI AG.
Warning: These citations may not always be 100% accurate.