VLSI的动态功耗测试生成
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Main Author: | |
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Format: | Article |
Language: | zho |
Published: |
Editorial Department of Journal on Communications
1994-01-01
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Series: | Tongxin xuebao |
Online Access: | http://www.joconline.com.cn/zh/article/74380757/ |
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_version_ | 1841538339873751040 |
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author | 金树泽 |
author_facet | 金树泽 |
author_sort | 金树泽 |
collection | DOAJ |
format | Article |
id | doaj-art-855d6bb29fe14ad39127567202d8d660 |
institution | Kabale University |
issn | 1000-436X |
language | zho |
publishDate | 1994-01-01 |
publisher | Editorial Department of Journal on Communications |
record_format | Article |
series | Tongxin xuebao |
spelling | doaj-art-855d6bb29fe14ad39127567202d8d6602025-01-14T07:55:23ZzhoEditorial Department of Journal on CommunicationsTongxin xuebao1000-436X1994-01-0174380757VLSI的动态功耗测试生成金树泽http://www.joconline.com.cn/zh/article/74380757/ |
spellingShingle | 金树泽 VLSI的动态功耗测试生成 Tongxin xuebao |
title | VLSI的动态功耗测试生成 |
title_full | VLSI的动态功耗测试生成 |
title_fullStr | VLSI的动态功耗测试生成 |
title_full_unstemmed | VLSI的动态功耗测试生成 |
title_short | VLSI的动态功耗测试生成 |
title_sort | vlsi的动态功耗测试生成 |
url | http://www.joconline.com.cn/zh/article/74380757/ |
work_keys_str_mv | AT jīnshùzé vlsidedòngtàigōnghàocèshìshēngchéng |