Single-event upset simulation and detection in configuration memory
Single-event upsets (SEUs) from radiation strikes in configuration memory are potentially catastrophic due to their widespread effects. For field-programmable gate arrays (FPGAs), faults in configuration memory propagate into the implemented logic design at the hardware interconnection level, leadin...
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| Main Authors: | , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Frontiers Media S.A.
2025-07-01
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| Series: | Frontiers in Space Technologies |
| Subjects: | |
| Online Access: | https://www.frontiersin.org/articles/10.3389/frspt.2025.1610424/full |
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