Suresh, V., Balasubramaniam, B., Yeh, L., & Li, B. Recent Advances in In Situ 3D Surface Topographical Monitoring for Additive Manufacturing Processes. MDPI AG.
Chicago Style (17th ed.) CitationSuresh, Vignesh, Badrinath Balasubramaniam, Li-Hsin Yeh, and Beiwen Li. Recent Advances in In Situ 3D Surface Topographical Monitoring for Additive Manufacturing Processes. MDPI AG.
MLA (9th ed.) CitationSuresh, Vignesh, et al. Recent Advances in In Situ 3D Surface Topographical Monitoring for Additive Manufacturing Processes. MDPI AG.
Warning: These citations may not always be 100% accurate.