Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm

To improve the performance of Radio Frequency Identification (RFID) multi-label systems, the multi-label network structure needs to be quickly located and optimized. A multi-label location measurement method based on the NLM–Harris algorithm is proposed in this paper. Firstly, multi-label geometric...

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Main Authors: Lin Li, Zhixin Jin, Junji Li, Zelin Zhang
Format: Article
Language:English
Published: MDPI AG 2025-01-01
Series:Sensors
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Online Access:https://www.mdpi.com/1424-8220/25/2/426
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author Lin Li
Zhixin Jin
Junji Li
Zelin Zhang
author_facet Lin Li
Zhixin Jin
Junji Li
Zelin Zhang
author_sort Lin Li
collection DOAJ
description To improve the performance of Radio Frequency Identification (RFID) multi-label systems, the multi-label network structure needs to be quickly located and optimized. A multi-label location measurement method based on the NLM–Harris algorithm is proposed in this paper. Firstly, multi-label geometric distribution images are obtained through a label image acquisition system of a multi-label semi-physical simulation platform with two vertical Charge-Coupled Device (CCD) cameras, and Gaussian noise is added to the image to simulate thermoelectric interference. Then, a fast NLM algorithm that optimizes the kernel coefficient acquisition speed is used for image denoising. Finally, the Harris corner algorithm is used to obtain the corner points of the images. After screening the diagonal points, the pixel coordinates of the preset origin and the four corners of the labels are obtained. Furthermore, the actual coordinates of the labels are obtained according to the pixel relationship. The results show that the average absolute errors of x, y, and z coordinates are 0.773 mm, 0.782 mm, and 0.807 mm, respectively. In addition, the relative errors are 1.659%, 2.260%, and 0.258%, which shows the high location accuracy of the multi-label network. It is of great significance to measure and optimize the performance of multi-label systems.
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spelling doaj-art-83abdff3cf8d4639af788b701616eb682025-01-24T13:48:53ZengMDPI AGSensors1424-82202025-01-0125242610.3390/s25020426Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris AlgorithmLin Li0Zhixin Jin1Junji Li2Zelin Zhang3School of Electronic Information Engineering, Taiyuan University of Science and Technology, Taiyuan 030024, ChinaCollege of Physical Education, Taiyuan University of Science and Technology, Taiyuan 030024, ChinaSchool of Electronic Information Engineering, Taiyuan University of Science and Technology, Taiyuan 030024, ChinaPeking University Yangtze River Delta Institute of Optoelectronics, Nantong 100871, ChinaTo improve the performance of Radio Frequency Identification (RFID) multi-label systems, the multi-label network structure needs to be quickly located and optimized. A multi-label location measurement method based on the NLM–Harris algorithm is proposed in this paper. Firstly, multi-label geometric distribution images are obtained through a label image acquisition system of a multi-label semi-physical simulation platform with two vertical Charge-Coupled Device (CCD) cameras, and Gaussian noise is added to the image to simulate thermoelectric interference. Then, a fast NLM algorithm that optimizes the kernel coefficient acquisition speed is used for image denoising. Finally, the Harris corner algorithm is used to obtain the corner points of the images. After screening the diagonal points, the pixel coordinates of the preset origin and the four corners of the labels are obtained. Furthermore, the actual coordinates of the labels are obtained according to the pixel relationship. The results show that the average absolute errors of x, y, and z coordinates are 0.773 mm, 0.782 mm, and 0.807 mm, respectively. In addition, the relative errors are 1.659%, 2.260%, and 0.258%, which shows the high location accuracy of the multi-label network. It is of great significance to measure and optimize the performance of multi-label systems.https://www.mdpi.com/1424-8220/25/2/426measurementCCDRFIDimage processinggolden sectionHarris corner detection
spellingShingle Lin Li
Zhixin Jin
Junji Li
Zelin Zhang
Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
Sensors
measurement
CCD
RFID
image processing
golden section
Harris corner detection
title Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
title_full Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
title_fullStr Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
title_full_unstemmed Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
title_short Novel RFID Multi-Label Network Location Measurement by Dual CCD and Non-Local Means–Harris Algorithm
title_sort novel rfid multi label network location measurement by dual ccd and non local means harris algorithm
topic measurement
CCD
RFID
image processing
golden section
Harris corner detection
url https://www.mdpi.com/1424-8220/25/2/426
work_keys_str_mv AT linli novelrfidmultilabelnetworklocationmeasurementbydualccdandnonlocalmeansharrisalgorithm
AT zhixinjin novelrfidmultilabelnetworklocationmeasurementbydualccdandnonlocalmeansharrisalgorithm
AT junjili novelrfidmultilabelnetworklocationmeasurementbydualccdandnonlocalmeansharrisalgorithm
AT zelinzhang novelrfidmultilabelnetworklocationmeasurementbydualccdandnonlocalmeansharrisalgorithm