Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications

This paper presents a novel approach to fabricate substrate integrated waveguides (SIWs) on glass substrates with tin (Sn) through glass vias (TGVs) tailored for millimeter-wave applications. The fabrication process employs a custom-designed vacuum suctioning system to rapidly fill precise TGV holes...

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Main Authors: Seung-Han Chung, Ho-Sun Yeom, Che-Heung Kim, Yong-Kweon Kim, Seung-Ki Lee, Chang-Wook Baek, Jae-Hyoung Park
Format: Article
Language:English
Published: MDPI AG 2024-12-01
Series:Micromachines
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Online Access:https://www.mdpi.com/2072-666X/16/1/12
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author Seung-Han Chung
Ho-Sun Yeom
Che-Heung Kim
Yong-Kweon Kim
Seung-Ki Lee
Chang-Wook Baek
Jae-Hyoung Park
author_facet Seung-Han Chung
Ho-Sun Yeom
Che-Heung Kim
Yong-Kweon Kim
Seung-Ki Lee
Chang-Wook Baek
Jae-Hyoung Park
author_sort Seung-Han Chung
collection DOAJ
description This paper presents a novel approach to fabricate substrate integrated waveguides (SIWs) on glass substrates with tin (Sn) through glass vias (TGVs) tailored for millimeter-wave applications. The fabrication process employs a custom-designed vacuum suctioning system to rapidly fill precise TGV holes in the glass substrate, which are formed by wafer-level glass reflow micromachining techniques with molten tin in a minute. This method offers a very fast and cost-effective alternative for complete via filling without voids compared to the conventional metallization techniques such as electroplating or sputtering. An SIW with a 3-dB cutoff frequency of 17.2 GHz was fabricated using the proposed process. The fabricated SIW shows an average insertion loss of 1.65 ± 0.54 dB across the 20–35 GHz range. These results highlight the potential of glass substrates with tin TGVs for fabricating millimeter-wave devices.
format Article
id doaj-art-821f808cad8d414b97f082d2364f505c
institution Kabale University
issn 2072-666X
language English
publishDate 2024-12-01
publisher MDPI AG
record_format Article
series Micromachines
spelling doaj-art-821f808cad8d414b97f082d2364f505c2025-01-24T13:41:50ZengMDPI AGMicromachines2072-666X2024-12-011611210.3390/mi16010012Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave ApplicationsSeung-Han Chung0Ho-Sun Yeom1Che-Heung Kim2Yong-Kweon Kim3Seung-Ki Lee4Chang-Wook Baek5Jae-Hyoung Park6Department of Electrical and Computer Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 08826, Republic of KoreaDepartment of Foundry Engineering, Dankook University, Yongin 16890, Republic of KoreaDepartment of Electrical and Computer Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 08826, Republic of KoreaDepartment of Electrical and Computer Engineering, Seoul National University, 1 Gwanak-ro, Gwanak-gu, Seoul 08826, Republic of KoreaDepartment of Semiconductor Convergence Engineering, Dankook University, Yongin 16890, Republic of KoreaSchool of Electrical and Electronics Engineering, Chung-Ang University, 84 Heukseok-ro, Dongjak-gu, Seoul 06974, Republic of KoreaDepartment of Foundry Engineering, Dankook University, Yongin 16890, Republic of KoreaThis paper presents a novel approach to fabricate substrate integrated waveguides (SIWs) on glass substrates with tin (Sn) through glass vias (TGVs) tailored for millimeter-wave applications. The fabrication process employs a custom-designed vacuum suctioning system to rapidly fill precise TGV holes in the glass substrate, which are formed by wafer-level glass reflow micromachining techniques with molten tin in a minute. This method offers a very fast and cost-effective alternative for complete via filling without voids compared to the conventional metallization techniques such as electroplating or sputtering. An SIW with a 3-dB cutoff frequency of 17.2 GHz was fabricated using the proposed process. The fabricated SIW shows an average insertion loss of 1.65 ± 0.54 dB across the 20–35 GHz range. These results highlight the potential of glass substrates with tin TGVs for fabricating millimeter-wave devices.https://www.mdpi.com/2072-666X/16/1/12substrate integrated waveguide (SIW)through glass via (TGV)tin (Sn) viasvacuum suctioning systemmicromachining
spellingShingle Seung-Han Chung
Ho-Sun Yeom
Che-Heung Kim
Yong-Kweon Kim
Seung-Ki Lee
Chang-Wook Baek
Jae-Hyoung Park
Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
Micromachines
substrate integrated waveguide (SIW)
through glass via (TGV)
tin (Sn) vias
vacuum suctioning system
micromachining
title Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
title_full Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
title_fullStr Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
title_full_unstemmed Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
title_short Substrate Integrated Waveguide on Glass with Vacuum-Filled Tin Through Glass Vias for Millimeter-Wave Applications
title_sort substrate integrated waveguide on glass with vacuum filled tin through glass vias for millimeter wave applications
topic substrate integrated waveguide (SIW)
through glass via (TGV)
tin (Sn) vias
vacuum suctioning system
micromachining
url https://www.mdpi.com/2072-666X/16/1/12
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