Enhanced soft error resilience of NBTI-tolerant dual mode Schmitt trigger circuit
Abstract A dual-mode inverting Schmitt trigger (DM-IST) circuit is presented. The proposed DM-IST circuit is configured with a single PMOS in pull-up and five NMOS in pull-down networks to reduce the effect of negative bias temperature instability (NBTI) on the circuit. Owing to NBTI, the increase i...
Saved in:
| Main Authors: | , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-07-01
|
| Series: | Scientific Reports |
| Subjects: | |
| Online Access: | https://doi.org/10.1038/s41598-025-11595-6 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Be the first to leave a comment!