Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene
The effect of thickness variation on the memory behavior of the polymethylmethacrylate-(PMMA)-based devices has been investigated. The PMMA film thicknesses have been varied between 5 to 300 nm, and we have found that the film thickness determines the type of behavior: ohmic, write-once-read-many-ti...
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| Format: | Article |
| Language: | English |
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Wiley
2011-01-01
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| Series: | Journal of Nanotechnology |
| Online Access: | http://dx.doi.org/10.1155/2011/702464 |
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| author | J. A. Avila-Niño A. O. Sustaita M. Reyes-Reyes R. López-Sandoval |
| author_facet | J. A. Avila-Niño A. O. Sustaita M. Reyes-Reyes R. López-Sandoval |
| author_sort | J. A. Avila-Niño |
| collection | DOAJ |
| description | The effect of thickness variation on the memory behavior of the polymethylmethacrylate-(PMMA)-based devices has been investigated. The PMMA film thicknesses have been varied between 5 to 300 nm, and we have found that the film thickness determines the type of behavior: ohmic, write-once-read-many-times (WORM) memory with two ON states, WORM memory with a negative differential resistance (NDR) region, and WORM memory without NDR region. The fact that similar results were obtained using different solvents to dilute PMMA (chlorobenzene, chloroform, and dimethyl sulfoxide), as well as using an other insulating polymer such as polystyrene (PS), leads to the conclusion that the phenomenon of memory depends on the aluminum electrodes, organic film thickness, and the compliance current used during the electroformation whereas the type of organic layer (PMMA or PS) has minor influence. From here, we conclude that the conductivity switching of the insulator organic film is due to the injection of aluminum particles into the film during the first voltage cycle. |
| format | Article |
| id | doaj-art-8029b8a0db45424586ae2ff4c36320eb |
| institution | Kabale University |
| issn | 1687-9503 1687-9511 |
| language | English |
| publishDate | 2011-01-01 |
| publisher | Wiley |
| record_format | Article |
| series | Journal of Nanotechnology |
| spelling | doaj-art-8029b8a0db45424586ae2ff4c36320eb2025-08-20T03:35:15ZengWileyJournal of Nanotechnology1687-95031687-95112011-01-01201110.1155/2011/702464702464Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the PolystyreneJ. A. Avila-Niño0A. O. Sustaita1M. Reyes-Reyes2R. López-Sandoval3Instituto de Investigación en Comunicación Optica, Universidad Autónoma de San Luis Potosí, Alvaro Obregon 64, 78000 San Luis Potosí, SLP, MexicoDivisión de Materiales Avanzados, IPICYT, Camino a la Presa San José 2055, Colonia Lomas 4a Sección, 78216 San Luis Potosí, SLP, MexicoInstituto de Investigación en Comunicación Optica, Universidad Autónoma de San Luis Potosí, Alvaro Obregon 64, 78000 San Luis Potosí, SLP, MexicoDivisión de Materiales Avanzados, IPICYT, Camino a la Presa San José 2055, Colonia Lomas 4a Sección, 78216 San Luis Potosí, SLP, MexicoThe effect of thickness variation on the memory behavior of the polymethylmethacrylate-(PMMA)-based devices has been investigated. The PMMA film thicknesses have been varied between 5 to 300 nm, and we have found that the film thickness determines the type of behavior: ohmic, write-once-read-many-times (WORM) memory with two ON states, WORM memory with a negative differential resistance (NDR) region, and WORM memory without NDR region. The fact that similar results were obtained using different solvents to dilute PMMA (chlorobenzene, chloroform, and dimethyl sulfoxide), as well as using an other insulating polymer such as polystyrene (PS), leads to the conclusion that the phenomenon of memory depends on the aluminum electrodes, organic film thickness, and the compliance current used during the electroformation whereas the type of organic layer (PMMA or PS) has minor influence. From here, we conclude that the conductivity switching of the insulator organic film is due to the injection of aluminum particles into the film during the first voltage cycle.http://dx.doi.org/10.1155/2011/702464 |
| spellingShingle | J. A. Avila-Niño A. O. Sustaita M. Reyes-Reyes R. López-Sandoval Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene Journal of Nanotechnology |
| title | Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene |
| title_full | Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene |
| title_fullStr | Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene |
| title_full_unstemmed | Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene |
| title_short | Effect of the Thickness of Insulator Polymeric Films on the Memory Behavior: The Case of the Polymethylmethacrylate and the Polystyrene |
| title_sort | effect of the thickness of insulator polymeric films on the memory behavior the case of the polymethylmethacrylate and the polystyrene |
| url | http://dx.doi.org/10.1155/2011/702464 |
| work_keys_str_mv | AT jaavilanino effectofthethicknessofinsulatorpolymericfilmsonthememorybehaviorthecaseofthepolymethylmethacrylateandthepolystyrene AT aosustaita effectofthethicknessofinsulatorpolymericfilmsonthememorybehaviorthecaseofthepolymethylmethacrylateandthepolystyrene AT mreyesreyes effectofthethicknessofinsulatorpolymericfilmsonthememorybehaviorthecaseofthepolymethylmethacrylateandthepolystyrene AT rlopezsandoval effectofthethicknessofinsulatorpolymericfilmsonthememorybehaviorthecaseofthepolymethylmethacrylateandthepolystyrene |