APA (7th ed.) Citation

Omura, Y. Feasible Time Evolution Model That Predicts Breakdown in Thin SiO2 Films within Unstressed Interval after Constant-Current Stress. Wiley.

Chicago Style (17th ed.) Citation

Omura, Yasuhisa. Feasible Time Evolution Model That Predicts Breakdown in Thin SiO2 Films Within Unstressed Interval After Constant-Current Stress. Wiley.

MLA (9th ed.) Citation

Omura, Yasuhisa. Feasible Time Evolution Model That Predicts Breakdown in Thin SiO2 Films Within Unstressed Interval After Constant-Current Stress. Wiley.

Warning: These citations may not always be 100% accurate.