An automatic and unsupervised image mask acquisition method based on generative adversarial networks

This paper proposes an unsupervised method for automatically labelling and obtaining image masks in defect detection. Since it is very labour intensive to acquire the image masks needed for deep learning (e.g. in semantic segmentation tasks) via manual labelling, we propose a method that utilize a g...

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Main Authors: Hao Wu, Yulong Liu, Jiankang Yang
Format: Article
Language:English
Published: Taylor & Francis Group 2024-12-01
Series:Systems Science & Control Engineering
Subjects:
Online Access:https://www.tandfonline.com/doi/10.1080/21642583.2023.2300835
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_version_ 1850063731634995200
author Hao Wu
Yulong Liu
Jiankang Yang
author_facet Hao Wu
Yulong Liu
Jiankang Yang
author_sort Hao Wu
collection DOAJ
description This paper proposes an unsupervised method for automatically labelling and obtaining image masks in defect detection. Since it is very labour intensive to acquire the image masks needed for deep learning (e.g. in semantic segmentation tasks) via manual labelling, we propose a method that utilize a generative adversarial network to obtain image masks automatically. Using this method, it is only necessary to input a considerable defect-free image to train. Then the proposed method can generate defect-free image samples like the input defect images, and the defect's location can be determined by comparing the input sample image containing defects with the generated sample image, thereby obtaining the input image mask. Our proposed method has been validated through experimental results, demonstrating its effectiveness. In addition to automatically and obtaining the required masks, our method achieved greater detection accuracy using the deep learning model Mask R-CNN compared with the manual labelling supervised method and a semi-supervised method.
format Article
id doaj-art-7e1bd8aa12ce42a7bcd20353e3e0f822
institution DOAJ
issn 2164-2583
language English
publishDate 2024-12-01
publisher Taylor & Francis Group
record_format Article
series Systems Science & Control Engineering
spelling doaj-art-7e1bd8aa12ce42a7bcd20353e3e0f8222025-08-20T02:49:30ZengTaylor & Francis GroupSystems Science & Control Engineering2164-25832024-12-0112110.1080/21642583.2023.2300835An automatic and unsupervised image mask acquisition method based on generative adversarial networksHao Wu0Yulong Liu1Jiankang Yang2School of Mechanical Engineering, Anhui University of Technology, Maanshan, People’s Republic of ChinaSchool of Mechanical Engineering, Anhui University of Technology, Maanshan, People’s Republic of ChinaSchool of Mechanical Engineering, Anhui University of Technology, Maanshan, People’s Republic of ChinaThis paper proposes an unsupervised method for automatically labelling and obtaining image masks in defect detection. Since it is very labour intensive to acquire the image masks needed for deep learning (e.g. in semantic segmentation tasks) via manual labelling, we propose a method that utilize a generative adversarial network to obtain image masks automatically. Using this method, it is only necessary to input a considerable defect-free image to train. Then the proposed method can generate defect-free image samples like the input defect images, and the defect's location can be determined by comparing the input sample image containing defects with the generated sample image, thereby obtaining the input image mask. Our proposed method has been validated through experimental results, demonstrating its effectiveness. In addition to automatically and obtaining the required masks, our method achieved greater detection accuracy using the deep learning model Mask R-CNN compared with the manual labelling supervised method and a semi-supervised method.https://www.tandfonline.com/doi/10.1080/21642583.2023.2300835Deep learningdefect detectionMask R-CNN
spellingShingle Hao Wu
Yulong Liu
Jiankang Yang
An automatic and unsupervised image mask acquisition method based on generative adversarial networks
Systems Science & Control Engineering
Deep learning
defect detection
Mask R-CNN
title An automatic and unsupervised image mask acquisition method based on generative adversarial networks
title_full An automatic and unsupervised image mask acquisition method based on generative adversarial networks
title_fullStr An automatic and unsupervised image mask acquisition method based on generative adversarial networks
title_full_unstemmed An automatic and unsupervised image mask acquisition method based on generative adversarial networks
title_short An automatic and unsupervised image mask acquisition method based on generative adversarial networks
title_sort automatic and unsupervised image mask acquisition method based on generative adversarial networks
topic Deep learning
defect detection
Mask R-CNN
url https://www.tandfonline.com/doi/10.1080/21642583.2023.2300835
work_keys_str_mv AT haowu anautomaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks
AT yulongliu anautomaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks
AT jiankangyang anautomaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks
AT haowu automaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks
AT yulongliu automaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks
AT jiankangyang automaticandunsupervisedimagemaskacquisitionmethodbasedongenerativeadversarialnetworks