Optical Characterization of Porous Sputtered Silver Thin Films

The optical properties of various porous silver films, grown with a commercial DC sputter coater, were investigated and compared for different plasma parameters. Effective Drude models were successfully used for those films whose spectra did not show particular resonance peaks. For the other films,...

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Main Authors: Olivier Carton, Jaouad Ghaymouni, Michaël Lejeune, Andreas Zeinert
Format: Article
Language:English
Published: Wiley 2013-01-01
Series:Journal of Spectroscopy
Online Access:http://dx.doi.org/10.1155/2013/307824
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author Olivier Carton
Jaouad Ghaymouni
Michaël Lejeune
Andreas Zeinert
author_facet Olivier Carton
Jaouad Ghaymouni
Michaël Lejeune
Andreas Zeinert
author_sort Olivier Carton
collection DOAJ
description The optical properties of various porous silver films, grown with a commercial DC sputter coater, were investigated and compared for different plasma parameters. Effective Drude models were successfully used for those films whose spectra did not show particular resonance peaks. For the other films, neither an effective Drude model nor effective medium models (Maxwell Garnett, Bruggeman, and Looyenga) can describe the optical properties. It turns out that a more general approach like the Bergman representation describes the optical data of these films accurately adopting porosity values consistent with physical measurements.
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institution Kabale University
issn 2314-4920
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language English
publishDate 2013-01-01
publisher Wiley
record_format Article
series Journal of Spectroscopy
spelling doaj-art-7ddf7a7ccb9446a2abe172939c7f8fe82025-02-03T01:07:50ZengWileyJournal of Spectroscopy2314-49202314-49392013-01-01201310.1155/2013/307824307824Optical Characterization of Porous Sputtered Silver Thin FilmsOlivier Carton0Jaouad Ghaymouni1Michaël Lejeune2Andreas Zeinert3Laboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex 1, FranceLaboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex 1, FranceLaboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex 1, FranceLaboratoire de Physique de la Matière Condensée, Université de Picardie Jules Verne, 33 rue Saint Leu, 80039 Amiens Cedex 1, FranceThe optical properties of various porous silver films, grown with a commercial DC sputter coater, were investigated and compared for different plasma parameters. Effective Drude models were successfully used for those films whose spectra did not show particular resonance peaks. For the other films, neither an effective Drude model nor effective medium models (Maxwell Garnett, Bruggeman, and Looyenga) can describe the optical properties. It turns out that a more general approach like the Bergman representation describes the optical data of these films accurately adopting porosity values consistent with physical measurements.http://dx.doi.org/10.1155/2013/307824
spellingShingle Olivier Carton
Jaouad Ghaymouni
Michaël Lejeune
Andreas Zeinert
Optical Characterization of Porous Sputtered Silver Thin Films
Journal of Spectroscopy
title Optical Characterization of Porous Sputtered Silver Thin Films
title_full Optical Characterization of Porous Sputtered Silver Thin Films
title_fullStr Optical Characterization of Porous Sputtered Silver Thin Films
title_full_unstemmed Optical Characterization of Porous Sputtered Silver Thin Films
title_short Optical Characterization of Porous Sputtered Silver Thin Films
title_sort optical characterization of porous sputtered silver thin films
url http://dx.doi.org/10.1155/2013/307824
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AT andreaszeinert opticalcharacterizationofporoussputteredsilverthinfilms