Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques

Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques

Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined. The longitudinal electric resistance of CNTs is ob...

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Bibliographic Details
Main Authors: D. V. Sokolov, N. A. Davletkildeev, I. A. Lobov
Format: Article
Language:English
Published: Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education 2018-07-01
Series:Омский научный вестник
Subjects:
carbon nanotubes
conductive atomic force microscopy
electrostatic force microscopy
electrical parameters
work function
conductivity
Online Access:https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/3%20(159)/114-117%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.,%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9B%D0%BE%D0%B1%D0%BE%D0%B2%20%D0%98.%20%D0%90..pdf
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