Determination of electrical parameters of individual multiwalled carbon nanotube using scanning probe microscopy techniques
Based on the combination of conductive atomic force microscopy (C-AFM) and electrostatic force microscopy (EFM), the electrical parameters of undoped, nitrogen- and boron-doped individual multiwalled carbon nanotubes (CNTs) have been determined. The longitudinal electric resistance of CNTs is ob...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Omsk State Technical University, Federal State Autonoumos Educational Institution of Higher Education
2018-07-01
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| Series: | Омский научный вестник |
| Subjects: | |
| Online Access: | https://www.omgtu.ru/general_information/media_omgtu/journal_of_omsk_research_journal/files/arhiv/2018/3%20(159)/114-117%20%D0%A1%D0%BE%D0%BA%D0%BE%D0%BB%D0%BE%D0%B2%20%D0%94.%20%D0%92.,%20%D0%94%D0%B0%D0%B2%D0%BB%D0%B5%D1%82%D0%BA%D0%B8%D0%BB%D1%8C%D0%B4%D0%B5%D0%B5%D0%B2%20%D0%9D.%20%D0%90.,%20%D0%9B%D0%BE%D0%B1%D0%BE%D0%B2%20%D0%98.%20%D0%90..pdf |
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| Summary: | Based on the combination of conductive atomic force microscopy
(C-AFM) and electrostatic force microscopy (EFM), the electrical
parameters of undoped, nitrogen- and boron-doped individual
multiwalled carbon nanotubes (CNTs) have been determined. The
longitudinal electric resistance of CNTs is obtained using C-AFM.
The determination of diameter, length and work function in CNT is based on the analysis of EFM data. Using two techniques of
scanning probe microscopy, electrical conductivity, free carriers
concentration, carriers mobility of individual multiwalled CNT are
evaluated. |
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| ISSN: | 1813-8225 2541-7541 |