Wang, X., Li, X., Zhang, Q., Wei, W., & Liu, E. Efficient Testing Light Path for Aspherical Surfaces Based on Secondary Imaging. MDPI AG.
Chicago Style (17th ed.) CitationWang, Xinrui, Xin Li, Quan Zhang, Wei Wei, and Enchao Liu. Efficient Testing Light Path for Aspherical Surfaces Based on Secondary Imaging. MDPI AG.
MLA (9th ed.) CitationWang, Xinrui, et al. Efficient Testing Light Path for Aspherical Surfaces Based on Secondary Imaging. MDPI AG.
Warning: These citations may not always be 100% accurate.