APA (7th ed.) Citation

Ajayan, J., Panigrahy, A. K., Sen, S., Kumar, M., & Tayal, S. Reliability Issues and Degradation Mechanisms of p-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review. IEEE.

Chicago Style (17th ed.) Citation

Ajayan, J., Asisa Kumar Panigrahy, Sachidananda Sen, Maneesh Kumar, and Shubham Tayal. Reliability Issues and Degradation Mechanisms of P-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review. IEEE.

MLA (9th ed.) Citation

Ajayan, J., et al. Reliability Issues and Degradation Mechanisms of P-GaN Gated E-Mode AlGaN/GaN Power HEMTs: A Critical Review. IEEE.