APA (7th ed.) Citation

Lopes, F., Amorin, L. H. C., Martins, L. d. S., Urbano, A., Appoloni, C. R., & Cesareo, R. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Wiley.

Chicago Style (17th ed.) Citation

Lopes, Fabio, Luís Henrique Cardozo Amorin, Larissa da Silva Martins, Alexandre Urbano, Carlos Roberto Appoloni, and Roberto Cesareo. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Wiley.

MLA (9th ed.) Citation

Lopes, Fabio, et al. Thickness Measurement of V2O5 Nanometric Thin Films Using a Portable XRF. Wiley.