Soft X-Ray Polarimeter: Potential Instrumentation and Observations
We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine t...
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| Format: | Article |
| Language: | English |
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Czech Technical University in Prague
2014-12-01
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| Series: | Acta Polytechnica CTU Proceedings |
| Online Access: | https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422 |
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| author | Herman L. Marshall Norbert S. Schulz |
| author_facet | Herman L. Marshall Norbert S. Schulz |
| author_sort | Herman L. Marshall |
| collection | DOAJ |
| description | We present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U - all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors >90% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small suborbital mission or adapted for use in an orbiting satellite to complement measurements at high energies. We present progress on laboratory work to demonstrate the capabilities of key components. |
| format | Article |
| id | doaj-art-7c355fd964204cd2a6cd41cfa56ddcbf |
| institution | Kabale University |
| issn | 2336-5382 |
| language | English |
| publishDate | 2014-12-01 |
| publisher | Czech Technical University in Prague |
| record_format | Article |
| series | Acta Polytechnica CTU Proceedings |
| spelling | doaj-art-7c355fd964204cd2a6cd41cfa56ddcbf2025-08-20T03:56:59ZengCzech Technical University in PragueActa Polytechnica CTU Proceedings2336-53822014-12-011128829210.14311/APP.2014.01.02882234Soft X-Ray Polarimeter: Potential Instrumentation and ObservationsHerman L. Marshall0Norbert S. Schulz1MIT Kavli Institute, Cambridge, MA, USAMIT Kavli Institute, Cambridge, MA, USAWe present an instrument design capable of measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics. A set of multilayer-coated flats reflects the dispersed X-rays to the instrument detectors. The intensity variation with position angle is measured to determine three Stokes parameters: I, Q, and U - all as a function of energy. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors >90% over the entire 0.2 to 0.8 keV band. This instrument could be used in a small suborbital mission or adapted for use in an orbiting satellite to complement measurements at high energies. We present progress on laboratory work to demonstrate the capabilities of key components.https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422 |
| spellingShingle | Herman L. Marshall Norbert S. Schulz Soft X-Ray Polarimeter: Potential Instrumentation and Observations Acta Polytechnica CTU Proceedings |
| title | Soft X-Ray Polarimeter: Potential Instrumentation and Observations |
| title_full | Soft X-Ray Polarimeter: Potential Instrumentation and Observations |
| title_fullStr | Soft X-Ray Polarimeter: Potential Instrumentation and Observations |
| title_full_unstemmed | Soft X-Ray Polarimeter: Potential Instrumentation and Observations |
| title_short | Soft X-Ray Polarimeter: Potential Instrumentation and Observations |
| title_sort | soft x ray polarimeter potential instrumentation and observations |
| url | https://ojs.cvut.cz/ojs/index.php/APP/article/view/2422 |
| work_keys_str_mv | AT hermanlmarshall softxraypolarimeterpotentialinstrumentationandobservations AT norbertsschulz softxraypolarimeterpotentialinstrumentationandobservations |