Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy

Total internal reflection fluorescence–structured illumination microscopy (TIRF-SIM) can enhance the lateral resolution of fluorescence microscopy to twice the diffraction limit, enabling subtler observations of activity in subcellular life. However, the lack of an axial resolution makes it difficul...

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Main Authors: Xiu Zheng, Xiaomian Cai, Wenjie Liu, Youhua Chen, Cuifang Kuang
Format: Article
Language:English
Published: MDPI AG 2025-06-01
Series:Photonics
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Online Access:https://www.mdpi.com/2304-6732/12/7/652
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author Xiu Zheng
Xiaomian Cai
Wenjie Liu
Youhua Chen
Cuifang Kuang
author_facet Xiu Zheng
Xiaomian Cai
Wenjie Liu
Youhua Chen
Cuifang Kuang
author_sort Xiu Zheng
collection DOAJ
description Total internal reflection fluorescence–structured illumination microscopy (TIRF-SIM) can enhance the lateral resolution of fluorescence microscopy to twice the diffraction limit, enabling subtler observations of activity in subcellular life. However, the lack of an axial resolution makes it difficult to resolve three-dimensional (3D) subcellular structures. In this paper, we present an alternative TIRF-SIM axial resolution enhancement method by exploiting quantitative information regarding the distance between fluorophores and the surface within the evanescent field. Combining the lateral super-resolution information of TIRF-SIM with reconstructed axial information, a 3D super-resolution image with a 25 nm axial resolution is achieved without attaching special optical components or high-power lasers. The reconstruction results of cell samples demonstrate that the axial resolution enhancement method for TIRF-SIM can effectively resolve the axial depth of densely structured regions.
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id doaj-art-7bf37f7c6b6645a8b770d8de76d9ef2c
institution DOAJ
issn 2304-6732
language English
publishDate 2025-06-01
publisher MDPI AG
record_format Article
series Photonics
spelling doaj-art-7bf37f7c6b6645a8b770d8de76d9ef2c2025-08-20T02:47:17ZengMDPI AGPhotonics2304-67322025-06-0112765210.3390/photonics12070652Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination MicroscopyXiu Zheng0Xiaomian Cai1Wenjie Liu2Youhua Chen3Cuifang Kuang4Ningbo Global Innovation Center, Zhejiang University, Ningbo 315100, ChinaNingbo Global Innovation Center, Zhejiang University, Ningbo 315100, ChinaCollege of Optical Science and Engineering, Zhejiang University, Hangzhou 310000, ChinaNingbo Global Innovation Center, Zhejiang University, Ningbo 315100, ChinaCollege of Optical Science and Engineering, Zhejiang University, Hangzhou 310000, ChinaTotal internal reflection fluorescence–structured illumination microscopy (TIRF-SIM) can enhance the lateral resolution of fluorescence microscopy to twice the diffraction limit, enabling subtler observations of activity in subcellular life. However, the lack of an axial resolution makes it difficult to resolve three-dimensional (3D) subcellular structures. In this paper, we present an alternative TIRF-SIM axial resolution enhancement method by exploiting quantitative information regarding the distance between fluorophores and the surface within the evanescent field. Combining the lateral super-resolution information of TIRF-SIM with reconstructed axial information, a 3D super-resolution image with a 25 nm axial resolution is achieved without attaching special optical components or high-power lasers. The reconstruction results of cell samples demonstrate that the axial resolution enhancement method for TIRF-SIM can effectively resolve the axial depth of densely structured regions.https://www.mdpi.com/2304-6732/12/7/652total internal reflection fluorescence microscopystructured illumination microscopyaxial resolution enhancementthree-dimensional super-resolution
spellingShingle Xiu Zheng
Xiaomian Cai
Wenjie Liu
Youhua Chen
Cuifang Kuang
Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
Photonics
total internal reflection fluorescence microscopy
structured illumination microscopy
axial resolution enhancement
three-dimensional super-resolution
title Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
title_full Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
title_fullStr Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
title_full_unstemmed Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
title_short Alternative Methods to Enhance the Axial Resolution of Total Internal Reflection Fluorescence–Structured Illumination Microscopy
title_sort alternative methods to enhance the axial resolution of total internal reflection fluorescence structured illumination microscopy
topic total internal reflection fluorescence microscopy
structured illumination microscopy
axial resolution enhancement
three-dimensional super-resolution
url https://www.mdpi.com/2304-6732/12/7/652
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AT xiaomiancai alternativemethodstoenhancetheaxialresolutionoftotalinternalreflectionfluorescencestructuredilluminationmicroscopy
AT wenjieliu alternativemethodstoenhancetheaxialresolutionoftotalinternalreflectionfluorescencestructuredilluminationmicroscopy
AT youhuachen alternativemethodstoenhancetheaxialresolutionoftotalinternalreflectionfluorescencestructuredilluminationmicroscopy
AT cuifangkuang alternativemethodstoenhancetheaxialresolutionoftotalinternalreflectionfluorescencestructuredilluminationmicroscopy