Residual Stress and Warping Analysis of the Nano-Silver Pressureless Sintering Process in SiC Power Device Packaging
Chip bonding, an essential process in power semiconductor device packaging, commonly includes welding and nano-silver sintering. Currently, most of the research on chip bonding technology focuses on the thermal stress analysis of tin–lead solder and nano-silver pressure-assisted sintering, whereas r...
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| Main Authors: | Wenchao Tian, Dexin Li, Haojie Dang, Shiqian Liang, Yizheng Zhang, Xiaojun Zhang, Si Chen, Xiaochuan Yu |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-08-01
|
| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/15/9/1087 |
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