Identification of polytypism and their dislocations in bilayer MoS2 using correlative transmission electron microscopy and Raman spectroscopy
Abstract Stacking orders and topological defects substantially influence the physical properties of 2D van der Waals (vdW) materials. However, the inherent features of 2D materials challenge the effectiveness of single characterization techniques in identifying stacking sequences, necessitating corr...
Saved in:
| Main Authors: | Xin Zhou, Tobias Dierke, Mingjian Wu, Shengbo You, Klaus Götz, Tobias Unruh, Philipp Pelz, Johannes Will, Janina Maultzsch, Erdmann Spiecker |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Nature Portfolio
2025-07-01
|
| Series: | npj 2D Materials and Applications |
| Online Access: | https://doi.org/10.1038/s41699-025-00575-z |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Sliding ferroelectric memories and synapses based on rhombohedral-stacked bilayer MoS2
by: Xiuzhen Li, et al.
Published: (2024-12-01) -
Achieving Ultra‐Low Contact Resistance via Copper‐Intercalated Bilayer MoS2
by: Huan Wang, et al.
Published: (2025-08-01) -
Ultra‐low power consumption flexible sensing electronics by dendritic bilayer MoS2
by: Lei Luo, et al.
Published: (2024-12-01) -
BAND STRUCTURE CALCULATIONS OF GRAPHENE POLYTYPES
by: E.A. Belenkov, et al.
Published: (2014-11-01) -
The electronic band structure of hexagonal silicon polytypes
by: Chizhova Anastasia, et al.
Published: (2024-12-01)