Malik, H. K., Juneja, S., & Kumar, S. Employing constant photocurrent method for the study of defects in silicon thin films. Oxford International Collaboration Centre Press (OICC press).
Chicago Style (17th ed.) CitationMalik, Hitendra K., Sucheta Juneja, and Sushil Kumar. Employing Constant Photocurrent Method for the Study of Defects in Silicon Thin Films. Oxford International Collaboration Centre Press (OICC press).
MLA (9th ed.) CitationMalik, Hitendra K., et al. Employing Constant Photocurrent Method for the Study of Defects in Silicon Thin Films. Oxford International Collaboration Centre Press (OICC press).
Warning: These citations may not always be 100% accurate.