Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface
We investigate the impact of tip changes on atomic-scale non-contact atomic force microscopy (NC-AFM) contrast formation when imaging a CaF2(111) surface. A change of the atomic contrast is explained by a polarity change of the tip-terminating cluster or by a polarity-preserving tip change via the r...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2025-06-01
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| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.16.72 |
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