Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface
We investigate the impact of tip changes on atomic-scale non-contact atomic force microscopy (NC-AFM) contrast formation when imaging a CaF2(111) surface. A change of the atomic contrast is explained by a polarity change of the tip-terminating cluster or by a polarity-preserving tip change via the r...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Beilstein-Institut
2025-06-01
|
| Series: | Beilstein Journal of Nanotechnology |
| Subjects: | |
| Online Access: | https://doi.org/10.3762/bjnano.16.72 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|