Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever
Abstract Optical radiation pressure caused by the force exerted by photons upon interacting with matter represents a crucial phenomenon for exploring physical and biological processes, particularly in the context of optical tweezers. However, accurately measuring the absolute value of radiation pres...
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Nature Portfolio
2025-07-01
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| Series: | Scientific Reports |
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| Online Access: | https://doi.org/10.1038/s41598-025-04812-9 |
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| author | Yuki Takei Hiromitsu Furukawa |
| author_facet | Yuki Takei Hiromitsu Furukawa |
| author_sort | Yuki Takei |
| collection | DOAJ |
| description | Abstract Optical radiation pressure caused by the force exerted by photons upon interacting with matter represents a crucial phenomenon for exploring physical and biological processes, particularly in the context of optical tweezers. However, accurately measuring the absolute value of radiation pressure presents a significant challenge owing to its inherently small magnitude. Conventional measurement setups are often complex and costly. This study demonstrates the measurement of radiation pressure using a near-infrared light-emitting diode (LED) in ambient conditions, employing a simple and cost-effective experimental setup. The radiation pressure was quantified by measuring the deflection of a highly sensitive microcantilever, achieving pressure measurements as low as 228 nPa, equivalent to a force of 21.5 fN. This represents the smallest absolute value of radiation pressure measured to date and marks the first successful application of an LED in such experiments under standard atmospheric conditions. The simplicity and affordability of this method make it a promising candidate for integration into compact devices for industrial applications, such as full-scale testing of sensitive pressure sensors used in atomic force microscopy, photoacoustic spectroscopy, and advancing the understanding of physical and biological phenomena. |
| format | Article |
| id | doaj-art-777c9db294884512beabc0e7f757c42e |
| institution | DOAJ |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-07-01 |
| publisher | Nature Portfolio |
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| series | Scientific Reports |
| spelling | doaj-art-777c9db294884512beabc0e7f757c42e2025-08-20T03:03:24ZengNature PortfolioScientific Reports2045-23222025-07-011511810.1038/s41598-025-04812-9Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantileverYuki Takei0Hiromitsu Furukawa1National Institute of Advanced Industrial Science and Technology (AIST)National Institute of Advanced Industrial Science and Technology (AIST)Abstract Optical radiation pressure caused by the force exerted by photons upon interacting with matter represents a crucial phenomenon for exploring physical and biological processes, particularly in the context of optical tweezers. However, accurately measuring the absolute value of radiation pressure presents a significant challenge owing to its inherently small magnitude. Conventional measurement setups are often complex and costly. This study demonstrates the measurement of radiation pressure using a near-infrared light-emitting diode (LED) in ambient conditions, employing a simple and cost-effective experimental setup. The radiation pressure was quantified by measuring the deflection of a highly sensitive microcantilever, achieving pressure measurements as low as 228 nPa, equivalent to a force of 21.5 fN. This represents the smallest absolute value of radiation pressure measured to date and marks the first successful application of an LED in such experiments under standard atmospheric conditions. The simplicity and affordability of this method make it a promising candidate for integration into compact devices for industrial applications, such as full-scale testing of sensitive pressure sensors used in atomic force microscopy, photoacoustic spectroscopy, and advancing the understanding of physical and biological phenomena.https://doi.org/10.1038/s41598-025-04812-9Optical radiation pressurePressure sensorMicroelectromechanical systems (MEMS) |
| spellingShingle | Yuki Takei Hiromitsu Furukawa Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever Scientific Reports Optical radiation pressure Pressure sensor Microelectromechanical systems (MEMS) |
| title | Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| title_full | Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| title_fullStr | Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| title_full_unstemmed | Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| title_short | Direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| title_sort | direct measurement of absolute radiation pressure of leds in nanopascal range under ambient conditions with microcantilever |
| topic | Optical radiation pressure Pressure sensor Microelectromechanical systems (MEMS) |
| url | https://doi.org/10.1038/s41598-025-04812-9 |
| work_keys_str_mv | AT yukitakei directmeasurementofabsoluteradiationpressureofledsinnanopascalrangeunderambientconditionswithmicrocantilever AT hiromitsufurukawa directmeasurementofabsoluteradiationpressureofledsinnanopascalrangeunderambientconditionswithmicrocantilever |