Chen, C., Wang, H., Wan, H., & Sun, D. Machine Learning Enabled High‐Throughput Screening of 2D Ultrawide Bandgap Semiconductors for Flexible Resistive Materials. Wiley-VCH.
Chicago Style (17th ed.) CitationChen, Chi, Hao Wang, Houzhao Wan, and Dan Sun. Machine Learning Enabled High‐Throughput Screening of 2D Ultrawide Bandgap Semiconductors for Flexible Resistive Materials. Wiley-VCH.
MLA (9th ed.) CitationChen, Chi, et al. Machine Learning Enabled High‐Throughput Screening of 2D Ultrawide Bandgap Semiconductors for Flexible Resistive Materials. Wiley-VCH.
Warning: These citations may not always be 100% accurate.