Sub-MHz homogeneous linewidth in epitaxial Y2O3: Eu3+ thin film on silicon

Thin films provide nanoscale confinement together with compatibility with photonic and microwave architectures, making them ideal candidates for chip-scale quantum devices. In this work, we propose a thin film fabrication approach yielding the epitaxial growth of Eu3+ doped Y2O3 on silicon. We combi...

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Bibliographic Details
Main Authors: Serrano Diana, Harada Nao, Bachelet Romain, Blin Anna, Ferrier Alban, Tiranov Alexey, Zhong Tian, Goldner Philippe, Tallaire Alexandre
Format: Article
Language:English
Published: De Gruyter 2025-02-01
Series:Nanophotonics
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Online Access:https://doi.org/10.1515/nanoph-2024-0682
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Summary:Thin films provide nanoscale confinement together with compatibility with photonic and microwave architectures, making them ideal candidates for chip-scale quantum devices. In this work, we propose a thin film fabrication approach yielding the epitaxial growth of Eu3+ doped Y2O3 on silicon. We combine two of the most prominent thin film deposition techniques: chemical vapor deposition (CVD) and molecular beam epitaxy (MBE). We report sub-megahertz optical homogeneous linewidths up to 8 K for the Eu3+ dopants in the film, and lowest value of 270 kHz. This result constitutes a ten-fold improvement with respect to previous reports on the same material, opening promising perspectives for the development of scalable and compact quantum devices containing rare-earth ions.
ISSN:2192-8614