Defect Engineering in Silver-Based Bimetallic Semiconductors: Recent Advances and Future Perspective

Saved in:
Bibliographic Details
Main Authors: Marcelo Assis, Ana Claudia Muniz Rennó, Juan Andrés, Elson Longo
Format: Article
Language:English
Published: American Chemical Society 2025-05-01
Series:ACS Omega
Online Access:https://doi.org/10.1021/acsomega.5c00524
Tags: Add Tag
No Tags, Be the first to tag this record!