Hergt, M., Hammer, B., Sack, M., Mayer, L. W., Nielebock, S., & Hiller, M. Modelling of SiC and GaN transistors based on pulsed S-parameter measurements. Elsevier.
Chicago Style (17th ed.) CitationHergt, Martin, Bernhard Hammer, Martin Sack, Lukas W. Mayer, Sebastian Nielebock, and Marc Hiller. Modelling of SiC and GaN Transistors Based on Pulsed S-parameter Measurements. Elsevier.
MLA (9th ed.) CitationHergt, Martin, et al. Modelling of SiC and GaN Transistors Based on Pulsed S-parameter Measurements. Elsevier.
Warning: These citations may not always be 100% accurate.