APA (7th ed.) Citation

Xu, A., Li, Y., Xie, H., Yang, R., Li, J., & Wang, J. Optimization and Validation of Wafer Surface Defect Detection Algorithm Based on RT-DETR. IEEE.

Chicago Style (17th ed.) Citation

Xu, Ao, Yanwei Li, Hongbo Xie, Rui Yang, Jianjie Li, and Jiaying Wang. Optimization and Validation of Wafer Surface Defect Detection Algorithm Based on RT-DETR. IEEE.

MLA (9th ed.) Citation

Xu, Ao, et al. Optimization and Validation of Wafer Surface Defect Detection Algorithm Based on RT-DETR. IEEE.