Accuracy of PVSyst Simulations in the Reproduction of the Yield Performance of Multicrystalline, Monocrsytalline and Monocasting Modules in Outdoor Conditions
In this study we performed field tests on three small installations consisting of 12 modules each and next to each other, all of them using exactly the same manufacturing technology for cells and modules and employing the same manufacturing equipment and raw materials. The only difference between t...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
TIB Open Publishing
2025-02-01
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| Series: | SiliconPV Conference Proceedings |
| Subjects: | |
| Online Access: | https://www.tib-op.org/ojs/index.php/siliconpv/article/view/1299 |
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| Summary: | In this study we performed field tests on three small installations consisting of 12 modules each and next to each other, all of them using exactly the same manufacturing technology for cells and modules and employing the same manufacturing equipment and raw materials. The only difference between the systems was the wafer technology used. Two of them were manufactured through the same casting technology (Direct solidification system-DSS) and the same equipment: in one of them we grew mc-Si and in the other one CM-Si (mono casting). In the third system we used traditional Czochralski monocrystalline wafers as technology. Two of the facilities (the DSS based ones) have been closely monitored for three years, and the traditional monocrystalline one for 17 months. For the three installations the performance data is shared and compared with PVsyst simulations and correlated well to each other.
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| ISSN: | 2940-2123 |